SIMS: Basic Principles and Components

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31. Mai 2021

Excellent course. It helped me a lot to to get the idea of the most of the concepts which are very necessary for my current research.

18. Mai 2020

It was very informative and I am happy to competed this wonderful course. Very point to point effort done by Coursera and MEPhI.

Aus der Unterrichtseinheit
Particle Diagnostics. Secondary Ion Mass Spectrometry (SIMS)
This module deals with methods which utilize heavy particles (protons and other ions) as primary bombarding particles. In SIMS sputtering yield is being analyzed, giving great information on surface composition.

Unterrichtet von

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    Sadovsky Yaroslav


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